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Design for Debug (DFD) and Design for Test (DFT)

Anish Kumar Dear Born Electronics India Bangalore

		Anthony Berent, ARM			Pramesh Dahiya, Integramicro System Pvt Ltd
		Doug Goodman, Ridgetop Group			Denis Rousseau Temento
		Michel Depeyrot Dolphin Integration

The increasing complexity of embedded circuits and the reduced accessibility of modern packaging and advancing technologies bound the utility of accepted standards in-circuit debugging tools, such as in-circuit emulators for microprocessors and microcontrollers. However, this same trend enables the development of more complex products, which in turn require more powerful debugging tools. These conflicting demands could be met if the standard scan test infrastructures now common in most complex components were able to match the debugging requirements of design verification and prototype validation. The main debug requirements in the design of microprocessor-based applications and the feasibility of their implementation using the mandatory, optional and additional operating modes will be analyzed. Despite the hardware issues, the most complex challenges to multiple processor design are in software. At high severity issue is how to partition the code execution among the processor. This is a critical decision that should be made early in the system design cycle. An improper method of allocating execution shall eliminate any potential advantage of using more than one processor.