Design Reuse
Search
D&R Products   

EETimes
Home/Introduction
Program Committee
Exhibition
Conference Program
Pratical Information
Training & Tutorials

"Validation - Test" Session

Moderated by Alain Greiner, University of Paris 6
Dec. 7, 2006 - 8:15-9:30
  • "High Density FPGA Package BIST Technique" by Douglas Goodman, James Hofmeister & Justin Judkins from Ridgetop Group Inc.

  • "A Python based SoC Validation and Test Environment" by Nicolas Tribie & Olivier Fargant from Wipro-Newlogic

  • "Remote Testing and Diagnosis of System-on-Chips using Network Management Frameworks" by Oussama Laouamri & Chouki Aktouf from DeFacTo Technologies

  • "Re-Use of Unit level verification framework" by Aniruddha Baljekar from NXP Semiconductors