Project maps ARM core variability at 32-nm
Peter Clarke, EETimes
9/21/2010 7:11 AM EDT
LONDON – A European collaborative research project has spent 2.5 years and 4.45 million euro (about $5.8 million) performing a characterization of an ARM926 core for the statistical variability that is inherent at the 32-nm manufacturing process node.
The project, called Reality for short and "Reliable and variability tolerant system-on-a-chip design in more-moore technologies" in full, was set up in 2008 to address issues around design for variability, which becomes increasingly significant at geometries below 32-nm.
E-mail This Article | Printer-Friendly Page |
Related News
- Cadence Library Characterization Solution Accelerates Delivery and Enhances Quality of Arm Memory Products
- Cadence Library Characterization Solution Accelerates Delivery and Enhances Quality of Arm Memory Products
- Yocto Project Welcomes New Members, Advances Open Source Embedded Systems Through Momentum
- Arm Drives Smart Utilities for KEPCO's Behind the Meter Project
- Arm's Project Trillium Offers the Industry's Most Scalable, Versatile ML Compute Platform
Breaking News
- Credo at TSMC 2024 North America Technology Symposium
- Cadence Reports First Quarter 2024 Financial Results
- Rambus Advances AI 2.0 with GDDR7 Memory Controller IP
- Faraday Reports First Quarter 2024 Results
- RAAAM Memory Technologies Closes $4M Seed Round to Commercialize Super Cost Effective On-Chip Memory Solutions
Most Popular
- GUC provides 3DIC ASIC total service package to AI/HPC/Networking customers
- Omni Design Technologies Joins Intel Foundry Accelerator IP Alliance
- Faraday Partners with Arm to Innovate AI-driven Vehicle ASICs
- Semiconductor Capacity Is Up, But Mind the Talent Gap
- Efabless Announces the Release of the OpenLane 2 Development Platform, Transforming Custom Silicon Design Flows