2.5 / 3.3 V Bidirectional LVTTL I/O combined with Analog Test Bus (ATB)

Features

• 1.0 V and 2.5 V devices overdriven to 3.3 V to save mask cost
• Operating frequency of 200MHz (400Mbps)
• Core supply is either 1.0 V or 1.1 V (+/- 5%)
• I/O supply is either 2.5 V or 3.3 V (+/- 10%)
• Operates over temperature range of -40C to 125C
• ESD hardness of 2kV HBM and 500V CDM
• Wire-bond and Flip-chip compatible 4 mA, 8 mA, 16 mA and 20 mA programmable drive strengths
• Programmable pull-up and pull-down (10 kohm)
• Selectable Schmitt trigger function for Rx
• Selectable Analog Test Bus
• Supports 8-layer (602) or 9-layer (702) metallization with Circuit Under Pad (CUP)
• Power supply sequence independent (PSSI)
• Compliant to JESD80 and normal range JESD8-5A in 2.5 V mode
• Compliant to JESD8C in 3.3 V mode
• Compliant to IEEE 802.3-2000 (MII) Electrical Specification

Benefits

• Low power
• Smaller Foot Print
• Higher Pad to PG ratio
• Faster Integration
• Services Available with this Product
• Customization
• SOC Integration
• Application & ESD Guidance
• Signal Integrity Analysis & Guidelines
• Characterization Support

Deliverables

• Specifications
• GDSII
• LEF
• LVS netlist
• Verilog Model
• Timing Model
• Documentation

• see the entire 2.5 / 3.3 V Bidirectional LVTTL I/O combined with Analog Test Bus (ATB) datasheet
• get in contact with 2.5 / 3.3 V Bidirectional LVTTL I/O combined with Analog Test Bus (ATB) Supplier