LVTTL33_ATB_CUP belongs to S_GPI_IO_T065GP, which is Sankalp’s General Purpose IO library in 65nm TSMC G+ process. It is a LVTTL bidirectional cell combined with an Analog Test bus which operates on 3.3 V or 2.5 V supply, at frequencies upto 200MHz (400 Mbps). The ATB can be used to measure voltages and currents in the analog circuitry with out a dedicated I/O Pad. Programmable pull-up, pull-down, drive strength and Schmitt trigger are some of the salient features for this cell. Cell dimensions are 25um x 190um.
Features
- 1.0 V and 2.5 V devices overdriven to 3.3 V to save mask cost
- Operating frequency of 200MHz (400Mbps)
- Core supply is either 1.0 V or 1.1 V (+/- 5%)
- I/O supply is either 2.5 V or 3.3 V (+/- 10%)
- Operates over temperature range of -40C to 125C
- ESD hardness of 2kV HBM and 500V CDM
- Wire-bond and Flip-chip compatible 4 mA, 8 mA, 16 mA and 20 mA programmable drive strengths
- Programmable pull-up and pull-down (10 kohm)
- Selectable Schmitt trigger function for Rx
- Selectable Analog Test Bus
- Supports 8-layer (602) or 9-layer (702) metallization with Circuit Under Pad (CUP)
- Power supply sequence independent (PSSI)
- Compliant to JESD80 and normal range JESD8-5A in 2.5 V mode
- Compliant to JESD8C in 3.3 V mode
- Compliant to IEEE 802.3-2000 (MII) Electrical Specification
Benefits
- Low power
- Smaller Foot Print
- Higher Pad to PG ratio
- Faster Integration
- Services Available with this Product
- Customization
- SOC Integration
- Application & ESD Guidance
- Signal Integrity Analysis & Guidelines
- Characterization Support
Deliverables
- Specifications
- GDSII
- LEF
- LVS netlist
- Verilog Model
- Timing Model
- Documentation