English
Achieving Certified IP Quality Efficiently
By Lorenzo di Gregorio, Infineon Technologies AG, Carlo del Giglio, Michael Siegel, OneSpin Solutions GmbH
May 29, 2007 -- edadesignline.com
While the increasing use of design intellectual property (IP) has considerably reduced design effort per gate for the chip designer, it has had an inverse effect on the chip-level integration and functional verification effort. IP verification and correct integration have become a dominant source of effort and risk in system-on-chip (SoC) projects.
In this article, we explain how we used complete formal functional verification that enables us as IP providers to certify highest IP quality, and to do so cost-effectively and with a high productivity of 2,000 to 4,000 lines of verified RTL code per engineer-month. The resulting IP quality significantly reduces the IP integrator's effort, cost and risk. Such results have the potential to fundamentally change the proliferation rate of IP and the profitability of the IP business.
May 29, 2007 -- edadesignline.com
While the increasing use of design intellectual property (IP) has considerably reduced design effort per gate for the chip designer, it has had an inverse effect on the chip-level integration and functional verification effort. IP verification and correct integration have become a dominant source of effort and risk in system-on-chip (SoC) projects.
In this article, we explain how we used complete formal functional verification that enables us as IP providers to certify highest IP quality, and to do so cost-effectively and with a high productivity of 2,000 to 4,000 lines of verified RTL code per engineer-month. The resulting IP quality significantly reduces the IP integrator's effort, cost and risk. Such results have the potential to fundamentally change the proliferation rate of IP and the profitability of the IP business.
|
E-mail This Article | 
|
|
Printer-Friendly Page |
Related Articles
New Articles
- Formal-based methodology cuts digital design IP verification time
- Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 1
- Pyramid Vector Quantization and Bit Level Sparsity in Weights for Efficient Neural Networks Inference
- Enabling Bluetooth Out-of-Band pairing through NFC
- Advantages and Challenges of Designing with Multiple Inferencing Chips