Dr. Ralph Marlett, Kiran Vittal, Atrenta Inc.
4/20/2011 2:15 AM EDT
Part 1 of this series discusses the problems with at-speed testing, and the various defect models and manufacturing test techniques. This part will tackle at-speed timing closure rules and at-speed coverage. It also looks into the at-speed coverage estimation and diagnosis of SpyGlass-DFT DSM.
The SpyGlass-DFT DSM product provides timing closure analysis and RTL testability for deep subµm (DSM) defects associated with at-speed testing. It is touted to provide accurate RTL fault coverage estimation for transition delay testing, together with diagnostics for low fault coverage, early in the design flow.
Figure 1: Complete RTL analysis solution for stuck-at and at-speed testing.
To access the full Design Article by Atrenta Inc. (in PDF Format), click here.
Facilitating at-speed test at RTL (Part 1)
About the authors:
. Dr. Ralph Marlett, Product Director, Atrenta Inc.
. Kiran Vittal, Product Marketing Director, Atrenta Inc.
Courtesy of EE Times India