English
Foundation IP for 7nm FinFETs: Design and Implementation
Jamil Kawa, Synopsys Fellow, Synopsys
Learn about the challenges of IP design and implementation for 7nm FinFETs. Along with the performance and area benefits that the node brings, designers must understand the significant technical challenges stemming from increasing variability associated with tighter pitches and more complex lithography steps. Design for variability and reliability considerations will require comprehensive modeling and analysis as well as advanced circuit techniques such as on chip sensing and compensation.
If you wish to download a copy of this white paper, click here
|
||||||
Related Articles
- Power analysis in 7nm Technology node
- Hardware-Assisted Verification: Ideal Foundation for RISC-V Adoption
- Implementation basics for autonomous driving vehicles
- An 800 Mpixels/s, ~260 LUTs Implementation of the QOI Lossless Image Compression Algorithm and its Improvement through Hilbert Scanning
- Easing PCIe 6.0 Integration from Design to Implementation
New Articles
- From a Lossless (~1.5:1) Compression Algorithm for Llama2 7B Weights to Variable Precision, Variable Range, Compressed Numeric Data Types for CNNs and LLMs
- Embracing a More Secure Era with TLS 1.3
- New PCIe Gen6 CXL3.0 retimer: a small chip for big next-gen AI
- Maximizing ESD protection for automotive Ethernet applications
Most Popular
|
E-mail This Article | 
|
|
Printer-Friendly Page |