Title Sign Up for SoC News Alert  |
Publication |
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Optimizing Floorplan for STA and Timing improvement in VLSI Design Flow |
Nov. 09, 2020 |
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Next Gen Scan Compression Technique to overcome Test challenges at Lower Technology Nodes (Part - I) |
Oct. 26, 2020 |
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VLSI Physical Design Methodology for ASIC Development with a Flavor of IP Hardening |
Oct. 19, 2020 |
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Reducing Debug time for Scan pattern using Parallel Strobe Data (PSD) Flow |
Sep. 21, 2020 |
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Optimization of Crosstalk Delta Delay on Clock Nets |
Aug. 24, 2020 |
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DDR IP Hardening - Overview & Advance Tips |
Jul. 27, 2020 |
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Scan Chains: PnR Outlook |
Jul. 20, 2020 |
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Antenna Effect in 16nm Technology Node |
Jun. 29, 2020 |
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Reduce ATPG Simulation Failure Debug Time by Understanding and Editing SPF |
May. 11, 2020 |
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Methodology to reduce Run Time of Timing/Functional Eco |
Apr. 27, 2020 |
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Embedded Software Unit Testing with Ceedling |
Apr. 14, 2020 |
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Shift Power Reduction Methods and Effectiveness for Testability in ASIC |
Mar. 16, 2020 |
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Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 2 |
Mar. 09, 2020 |
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Strategy To Fix Register-to-Register Timing For large Feedthrough Blocks Having Limited Internal Pipelines |
Mar. 05, 2020 |
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Layout versus Schematic (LVS) Debug |
Feb. 10, 2020 |
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Interface Timing Challenges and Solutions at Block Level |
Jan. 27, 2020 |
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Setup Margin Aware Quick Hold Fixing |
Jan. 13, 2020 |
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Understanding Shmoo Plots and Various Terminology of Testers |
Jan. 06, 2020 |
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Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 1 |
Dec. 09, 2019 |
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UVM RAL Model: Usage and Application |
Sep. 02, 2019 |
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Testing Of Repairable Embedded Memories in SoC: Approach and Challenges |
Jun. 17, 2019 |
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Area Overhead: GOH Control and Track |
May. 13, 2019 |
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Distorted Waveform Phenomena in 7nm Technology Node and its Impact on Signoff Timing Analysis |
May. 06, 2019 |
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System Verilog Macro: A Powerful Feature for Design Verification Projects |
Apr. 18, 2019 |
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Memory Testing - An Insight into Algorithms and Self Repair Mechanism |
Apr. 08, 2019 |
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Signoff Iteration Reduction Technique for Fixing Top Level Antenna |
Apr. 01, 2019 |
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A Heuristic Approach to Fix Design Rule Check (DRC) Violations in ASIC Designs @7nm FinFET Technology |
Mar. 25, 2019 |
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Reducing DFT Footprints: A Case in Consumer SoC |
Mar. 11, 2019 |
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Cost Reduction and Improved TTR with Shared Scan-in DFT CODEC |
Feb. 25, 2019 |
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A Guide on Logical Equivalence Checking - Flow, Challenges, and Benefits |
Feb. 11, 2019 |
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Designing an Effective Traffic Management System Through Vehicle Classification and Counting Techniques |
Nov. 29, 2018 |
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System Verilog Assertions Simplified |
Oct. 22, 2018 |
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Implementing Parallel Processing and Fine Control in Design Verification |
Sep. 17, 2018 |
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Usage of Multibit Flip-Flop and its Challenges in ASIC Physical Design |
Jul. 23, 2018 |
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Aircraft Jet Engine Failure Analytics Using Google Cloud Platform Based Deep Learning |
Apr. 09, 2018 |
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SoC Functional verification flow |
Dec. 21, 2017 |
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Wind Turbine Fault Detection Using Machine Learning And Neural Networks |
Dec. 18, 2017 |
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Ins and Outs of Assertion in Mixed Signal Verification |
Nov. 06, 2017 |
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Platform Software Verification Framework Solution for Safety Critical Systems |
Oct. 23, 2017 |
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Smart Tracking of SoC Verification Progress Using Synopsys' Hierarchical Verification Plan (HVP) |
Oct. 09, 2017 |
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Processor-In-Loop Simulation: Embedded Software Verification & Validation In Model Based Development |
Aug. 28, 2017 |
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UVM Sequence Library - Usage, Advantages, and Limitations |
Aug. 14, 2017 |
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Power Optimization using Multi BIT flops and MIMCAPs in 16nm technology and below |
Jun. 26, 2017 |
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Correlation of Routability and Placement Density for better QoR in 16nm technology |
May. 15, 2017 |
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Verification Planner in QuestaSim |
Apr. 03, 2017 |
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Applying DevOps to IoT solution development |
Mar. 07, 2017 |
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Design Rule Checks (DRC) - A Practical View for 28nm Technology |
Feb. 27, 2017 |
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API-based verification: Effective reuse of verification environment components |
Feb. 24, 2017 |
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A Review Paper on CMOS, SOI and FinFET Technology |
Feb. 01, 2017 |
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Understanding the Technology behind Traffic Sign Recognition (TSR) Systems |
Jan. 03, 2017 |
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Power of UVM's Command Line Argument Usage in Verification Test benches |
Oct. 20, 2016 |
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Verification "escapes" leave bugs in silicon |
Sep. 13, 2016 |
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Resets in FPGA & ASIC control and data paths |
Sep. 05, 2016 |
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Advanced BLDC Motor Control using Freescale Ultra Reliable MPC5676R/MPC5674F MCU |
Aug. 15, 2016 |
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Platform Software Verification Approaches For Safety Critical Systems |
Jul. 04, 2016 |
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ATPG Challenges at Lower Technology Nodes |
May. 23, 2016 |
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High bandwidth memory (HBM) PHY IP verification |
Feb. 24, 2016 |
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DFT strategy for IPs |
Jan. 11, 2016 |
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Multiple clock domain SoCs: Verification techniques |
Oct. 27, 2014 |
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Boundary scan: Seven benefits |
Jun. 26, 2014 |
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