Industry Expert Blogs
Let's Talk PVT Monitoring: Understanding Your Chip's AgeMoortec Blog
Mar. 10, 2016
In this, the second instalment of the "Let's Talk PVT Monitoring" series I chat with Oliver King about understanding your chip's age. As Moortec’s CTO, Oliver has been leading the development of compelling in-chip monitoring solutions to address problems associated with ever-shrinking System-on-Chip (SoC) process geometries. An analogue and mixed signal design engineer with over a decade of experience in low power design, Oliver is now heading up the expansion of Moortec's IP portfolio into new products on advanced nodes.
1.Why is understanding your chip's age important?
Semiconductor devices age over time, we all know that but what is often not well understood are the mechanisms for ageing or the limits that will cause a chip to fail. In addition, there is bound to be a requirement for a minimum lifetime of a device which will depend on application but could be two or three years for a consumer device and up to twenty-five years for a telecommunications device. Given that lifetime requirement and often poorly understood ageing processes, many chips designed today are over designed to ensure reliable operation. If you understand that ageing process or better still can monitor the ageing process then you can reduce the over design and potentially even build chips that react and adjust for the ageing effect, or predict when that chip is going to fail.
Chips at the moment are not getting anywhere near their total lifespan because in most cases there isn’t any in-chip monitoring taking place. I sometimes use the analogy of a rental car which you want to give back with an empty fuel tank. If your chip has a defined lifetime, then you want to run it as hard as you can to just perform within spec for the lifetime, or looking at it the other way, you want to hand your rental car back just as you run out of fuel.
2. What are the effects and mechanisms of ageing?
There are a number of mechanisms which contribute, the most notable ones are electromigration, hot carrier effects, and bias temperature instability. Whilst some of this can be mitigated through design techniques, and CAD tools exist to help with that, they can only go so far. In the case of bias temperature instability, the mechanisms are not fully known. Whilst traditionally only negative bias temperature instability (NBTI) was considered an issue, now, with the introduction of high K metal gates at 28nm positive bias temperature instability (PBTI) is now a problem as well.
The result of BTI is to raise threshold voltages, and the effect is very temperature dependant, so without a good model of device use it is hard to predict and thus design for. In addition, ageing effects in general are, by nature, hard to measure because it takes a long time even with acceleration techniques such as HTOL to get a device to end of life.
3. How can we help predict device lifetime?
From Moortec’s perspective we are working on monitors that can be used to measure the ageing process of a device in the field, by having reference structures and comparing them to live structures, we can compare the two over time. This is one application that is being used at the moment, alongside using the information to adjust the supply to bring the chip back to the performance level that you expect, or need. This is actually quite common, particularly in devices where there is a requirement for a particular throughput.
4. How does this help with choosing the lifestyle or your chip?
The thing is that ageing is complex and very dependent on use case and environment. In most modern applications neither of those is well known and often will vary over time itself.
If we take the smartphone as an example, there will be modes where it is doing very little - where the clock frequency is low, the voltage supply is low. At the other extreme it will be playing HD video - the clock will be run at high rates and the supply will be correspondingly high. Obviously if you took that device and left it in the low power state it would age at a significantly lower rate than if you left it in the high power state. The trouble is at design time you don’t know what that ratio is. Of course this example is actually already a simplified case because more often than not there will be more than two states so you have to make assumptions about time spent in each state, and build margins in to cope with the unknowns. By allowing the system to monitor that ageing then potentially you can optimise DVFS schemes, you can predict lifetime or perhaps even reign in certain modes to insure that a particular lifetime is met.
Another example is the bitcoin mining application. This is at the other end of the scale, where devices are manufactured to sit in large arrays. Each chip will vary with process and they will age differently partly as a result of process variation, and partly because their loads won’t always be equal. If you can monitor all those conditions, then you can optimise each of those chips to run at peak performance.
About the interviewee
Oliver King is the Chief Technology Officer of Moortec Semiconductor. Before joining Moortec in 2012, Oliver was part of the analogue design methodology team at Dialog Semiconductor and prior to that was a senior design engineer at Toumaz Technology. Oliver graduated from The University of Surrey in 2003 with a degree in Electrical and Electronic Engineering.
About Moortec Semiconductor
Moortec Semiconductor, established in 2005, provide high quality analog and mixed-signal Intellectual Property (IP) solutions world-wide specialising in die monitoring. Having a track record of delivery to tier-1 semiconductor and product companies, Moortec provide a quick and efficient path to market for customer products and innovations. For more information please visit www.moortec.com.
Contact: Ramsay Allen, +44 1752 875133, firstname.lastname@example.org
Search Silicon IP
- Let's Talk PVT Monitoring: Thermal Issues Associated with Modern SoCs - How Hot is Hot?
- Moortec "Let's Talk PVT Monitoring" Series with CTO Oliver King
- Let's Talk PVT Monitoring: Process Detection & Variability
- Let's Talk PVT Monitoring: Supply Monitoring on 28nm & FinFET - The Challenges Posed
- Let's Talk PVT Monitoring: AVS & DVFS