Design & Reuse

Study reveals IoT anxieties

by Junko Yoshida - Embedded.com, May. 14, 2015 – 

As the IoT World gets its mojo working in San Francisco this week, I find myself bombarded with tweets from the show floor. And I hear the devil on my shoulder saying, "Damn, girl! You’re missing all those stories."

As a reporter, that’s a horrible feeling. After all, I’m not there. I’m on my way to catch a flight to China.

But long trips come with opportunities. First thing, I can catch up on all the reading I never seem to have time for.


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