January 25, 2007
-- The rising demand for battery-powered devices requires Integrated Circuits with minimal leakage current in sleep mode. Starting from 130 nm, the leakage current becomes very significant and increases exponentially at 90 nm and beyond, taking an increasing share of the overall power consumption of a System-on-Chip. Minimizing the leakage current thus is crucial, which ususally comes at the expense of integration density: The “SESAME eLLvHD” library of Standard Cells is optimized for extremely low leakage, while preserving high density: it enables to divide the leakage power by 100.
In addition SESAME eLLvHD has all the RCSL advantages, as a reduced Cell Set Library, providing the optimal solution for Medical applications, RFID, Smart Cards, Portable multimedia and Wireless applications.
Already available at TSMC 90LP and readily ported to other technological processes, SESAME eLLvHD benefits from a unique “Try and Buy tutorial” for guiding your evaluation, not only for free, but for fun.
More information on www.dolphin-ip.com