SAN JOSE, Calif., Feb. 26, 2009 -- LogicVision, Inc. (Nasdaq: LGVN - News), a leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced that it has developed new technology that will enable easy access to chip level BIST capabilities for board and system-level test and maintenance activities. All of the advanced test and diagnostic functions used during device manufacturing test can now be made available to virtually any embedded CPU core or controlled from any external CPU bus such as I2C, allowing these embedded capabilities to be leveraged by system maintenance functions.
LogicVision's solutions provide high quality device test and diagnostic capabilities by integrating customized BIST controllers throughout the chip. Increasingly, these embedded capabilities originally used during semiconductor manufacturing test are being sought by system integrators to aid in product test and maintenance activities. Within a system, embedded resources are typically accessed through one or more embedded CPU cores connected to system-wide buses. In order to integrate into this existing infrastructure, LogicVision is introducing new CPU interface IP and supporting automation that enables any embedded CPU core to communicate with all of the BIST capabilities through any internal system bus. Necessary BIST configuration and protocol data are automatically converted to CPU specific read/write commands that can be directly stored into any CPU-accessible flash memory.
"Ensuring that a car's electronics are functioning properly when the engine is turned on, or being able to accurately identify which component is causing a computer to fail are examples of the significant value of incorporating system test and diagnostic functions in today's electronic systems," said Stephen Pateras, Vice-President of Marketing at LogicVision. "Making our BIST capabilities accessible at the system level provides a key component to fully achieving these capabilities."
The CPU interface support is immediately available as an option to any of the ETCreate(TM) family of products.
About LogicVision Inc. LogicVision (Nasdaq: LGVN - News) provides a comprehensive set of proprietary built-in-self-test (BIST) technologies for achieving the highest quality silicon manufacturing test while reducing test costs for complex System-on-Chip devices. LogicVision's Dragonfly Test Platform(TM) enables integrated circuit designers to embed BIST functionality into a semiconductor design. This functionality is used during semiconductor production test and throughout the useful life of the chip. The complete Dragonfly Test Platform, including the ETCreate(TM), Silicon Insight(TM) and Yield Insight(TM) product families, improves profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time-to-market and time-to-yield. For more information on the company and its products, please visit the LogicVision website at
www.logicvision.com.
