LogicVision Extends Built-In Self-Test Products to be Directly Controllable From Embedded CPU Cores, Easing System Test and Maintenance
LogicVision's solutions provide high quality device test and diagnostic capabilities by integrating customized BIST controllers throughout the chip. Increasingly, these embedded capabilities originally used during semiconductor manufacturing test are being sought by system integrators to aid in product test and maintenance activities. Within a system, embedded resources are typically accessed through one or more embedded CPU cores connected to system-wide buses. In order to integrate into this existing infrastructure, LogicVision is introducing new CPU interface IP and supporting automation that enables any embedded CPU core to communicate with all of the BIST capabilities through any internal system bus. Necessary BIST configuration and protocol data are automatically converted to CPU specific read/write commands that can be directly stored into any CPU-accessible flash memory.
"Ensuring that a car's electronics are functioning properly when the engine is turned on, or being able to accurately identify which component is causing a computer to fail are examples of the significant value of incorporating system test and diagnostic functions in today's electronic systems," said Stephen Pateras, Vice-President of Marketing at LogicVision. "Making our BIST capabilities accessible at the system level provides a key component to fully achieving these capabilities."
The CPU interface support is immediately available as an option to any of the ETCreate(TM) family of products.
About LogicVision Inc.
LogicVision (Nasdaq: LGVN - News) provides a comprehensive set of proprietary built-in-self-test (BIST) technologies for achieving the highest quality silicon manufacturing test while reducing test costs for complex System-on-Chip devices. LogicVision's Dragonfly Test Platform(TM) enables integrated circuit designers to embed BIST functionality into a semiconductor design. This functionality is used during semiconductor production test and throughout the useful life of the chip. The complete Dragonfly Test Platform, including the ETCreate(TM), Silicon Insight(TM) and Yield Insight(TM) product families, improves profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time-to-market and time-to-yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.
|
Related News
- LogicVision Announces Silicon Proven Memory Built-In Self-Test with Repair Capability
- Cadence and NEC Electronics Announce Encounter Digital Implementation System To Support NEC Electronics' System LSI with Built-In V850 CPU Core
- LogicVision and Dolphin Technology Announce Integration of 90nm and 65nm memories with Comprehensive Self-test and Repair Solutions
- Virage unveils self-test/repair memory for system-on-chip designs
- Synopsys' DesignWare STAR Memory System's New Test and Repair Capabilities Speed Embedded Memory Repair Time by 10x
Breaking News
- After TSMC fab in Japan, advanced packaging facility is next
- A System On Module (SoM) developed by Electra IC: BitFlex-SPB-A7 FPGA SoM
- Weebit Nano to demo its ReRAM technology on GlobalFoundries' 22FDX® platform
- SoC Secure Boot Hardware Engine IP Core Now Available from CAST
- QuickLogic and Zero-Error Systems Partner to Deliver Radiation-Tolerant eFPGA IP for Commercial Space Applications
Most Popular
- Former Moortec executives create chip monitor startup
- PrimisAI Unveils Premium Version of RapidGPT, Redefining Hardware Engineering
- Arteris Expands Ncore Cache Coherent Interconnect IP To Accelerate Leading-Edge Electronics Designs
- Arm Announces New Automotive Technologies to Accelerate Development of AI-enabled Vehicles by up to Two Years
- Arm's Broadest Ever Automotive Enhanced IP Portfolio Designed for the Future of Computing in Vehicles
E-mail This Article | Printer-Friendly Page |