Project maps ARM core variability at 32-nm

Peter Clarke, EETimes
9/21/2010 7:11 AM EDT

LONDON – A European collaborative research project has spent 2.5 years and 4.45 million euro (about $5.8 million) performing a characterization of an ARM926 core for the statistical variability that is inherent at the 32-nm manufacturing process node.

The project, called Reality for short and "Reliable and variability tolerant system-on-a-chip design in more-moore technologies" in full, was set up in 2008 to address issues around design for variability, which becomes increasingly significant at geometries below 32-nm.

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