LogicVision's Embedded Test 4.0 Integrates with Q-Star Test's Current Test Measurement Solutions
San Jose, Calif., April 22, 2002 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test IP for integrated circuits and systems, today announced that Q-Star Test nv, the premier provider of current-based (IDD) test and measurement solutions, has joined the LogicVision Ready™ partner program. The partnership will target the development of integrated solutions, combining LogicVision's Embedded Test Solution™ technology with Q-Star's (IDD) test and measurement solutions. The companies expect this integration to create a complete and efficient defect-oriented test solution for SoC devices, reducing test time, enhancing quality and reliability, and lowering test costs for the semiconductor industry.
The partnership will focus on two objectives. The first aims at offering real on-chip logic/IDD BIST based on linking the Q-Star Test IDD measurement IP with LogicVision's Embedded Test 4.0 circuitry. Q-Star Test's IP modules combine high-speed measurements with high accuracy/resolution for a very low area penalty. The second objective is ensuring the integrated solution that combines Q-Star Test's off-chip IDD(Q) measurement modules with on-chip LogicVision Embedded Test circuitry. This solution will be ATE independent and can be easily integrated on probe cards, loadboard or DUT boards.
"The increasing complexity of ICs and the growing pressures of maintaining test costs drive both our companies to develop optimized test strategies for our customers. Combining LogicVision's Embedded Test product with IDDx offers the most cost effective combined solution to assure product quality for both digital and analog devices while keeping test time under control," said Dr. Hans Manhaeve, Q Star Test's president and CEO. "In addition, such an approach paves the way to ensuring high quality testing using a low-cost DFT tester platform."
"We see this partnership as a tremendous opportunity to help the semiconductor industry find effective ways to control test costs. By offering a cost effective solution for SoC and DSM test, we are paving the way to the industry's use of low-cost DFT-based test systems," said Mukesh Mowji, LogicVision's vice president of marketing. "From this perspective, the cooperation between LogicVision and Q-Star Test provides solutions that overcome most of the issues and challenges surrounding advanced semiconductor test."
About Q-Star Test nv
Q-Star Test is the premier provider of current-based (IDD) test and measurement solutions. The company offers IDDx monitor solutions, supporting true IDDQ, delta IDDQ, IDDT, and analog IDD test strategies, which apply to digital, analog, and mixed-signal circuits. The company provides standard and customized products and services. Q-Star Test owns several supply current measurement technologies covered by a set of strategic patents. These technologies allow the creation of high-speed, high-accuracy supply current monitors, with the unique characteristic of being virtually transparent to the device under test and the automatic test equipment (ATE). Q-Star Test's worldwide web address is www.qstar.be. The company is located at L. Bauwensstraat 20, B-8200 Brugge, Belgium.
About LogicVision Inc.
LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision Web site at www.logicvision.com.
Except for the historical information contained herein, the matters set forth in this press release, including statements as the expected benefits of the integration of the companies' technologies, including the creation of a complete and efficient defect-oriented test solution for SoC devices, reducing test time, enhancing quality and reliability, and lowering test costs for the semiconductor industry, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the ability of the companies to integrate their technologies, the impact of technological advances and competitive products and other risks detailed from time to time in LogicVision's SEC reports, including its Annual Report on Form 10-K for the year ended December 31, 2001. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.
LogicVision, Embedded Test, LogicVision Ready and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other trademarks and service marks are the property of their respective owners.
Acronyms and Definitions
ATE: Automatic Test Equipment
ATPG: Automatic Test Pattern Generation
BIST: Built-in-Self-TestDFT: Design-for-Test
EDA: Electronic Design Automation
GDSII: An industry format describing the physical structure of the chip design and used to create mask tooling for chip manufacturing
GUI: Graphics User Interface
HDL: Hardware Description Language
IC: Integrated Circuit
RTL: Register Transfer-Level
Verilog: A hardware description language used to design and document electronic systems.
VHDL: VHSIC (Very High-Speed Integrated Circuit) HDL
IP: Intellectual Property