Built-in repair analysis simplifies use of redundant memories
San Jose, Calif. - May 6, 2003 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test for integrated circuits announces the availability of a silicon proven solution that provides automated test and repair. LogicVision, in cooperation with MoSys, Inc., fully qualified the combination of Mosys' 1T-SRAM" family of high-density embedded memories with LogicVision's IC Memory BIST and Built-In Repair Analysis support. A design containing multiple 1T-SRAM instances, Built-In Self-Test (BIST), as well as Built-In Repair Analysis (BIRA) was fabricated at a leading foundry to verify and validate the complete end-to-end memory test and repair process.
The introduction and deployment of advanced process technologies has resulted in significantly more embedded memory being used within SoC designs. Memory redundancy, repair, and reconfiguration are becoming necessary for yield management. Built-in repair analysis can help realize the yield benefits of memory repair without incurring additional costs due to the added complexity or test time associated with external failure data collection schemes. LogicVision's built-in repair analysis supports both fuse based (hard) and register based (soft) reconfiguration schemes.
"More and more customers have been asking for well integrated memory test and repair solutions," said Mukesh Mowji, LogicVision's Inc.'s vice president of sales and marketing. "This work with MoSys has leveraged LogicVision's leading technology in memory test and diagnostics to provide a total solution for embedded memory repair."
"LogicVision has demonstrated leadership in embedded test and diagnostic capabilities and has shown they can support a diverse manufacturing environment," Commented Mark-Eric Jones, MoSys' vice president and general manager for Intellectual Property. "We believe that customers using repairable memories will benefit from having well-proven integrated design and manufacturing solutions."
About LogicVision Inc.
LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.
About 1T-SRAM Technologies
MoSys' patented 1T-SRAM technologies offer a combination of high density, low power consumption, high speed and low cost unmatched by other available memory technologies. The single transistor bit cell used in 1T-SRAM memory results in the technology achieving much higher density than traditional four or six transistor SRAMs while using the same standard logic manufacturing processes.
1T-SRAM technologies also offer the familiar, refresh-free interface and high performance for random address access cycles associated with traditional SRAMs. In addition, these technologies can reduce operating power consumption by a factor of four compared with traditional SRAM technology, contributing to making them ideal for embedding large memories in System on Chip (SoC) designs.
1T-SRAM® is a MoSys trademark registered in the U.S. Patent and Trademark Office. All other trade, product, or service names referenced in this release may be trademarks or registered trademarks of their respective holders.
FORWARD LOOKING STATEMENTS:
Except for the historical information contained herein, the matters set forth in this press release, including statements such as the features and benefits of the companies' products and combined solutions are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risk and uncertainties that could cause actual results to differ materially, including, but not limited to, the impact of competitive products and technological advances, and other risks detailed in LogicVision's Form 10-K for the year ended December 31, 2002, and from time to time in LogicVision's SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.
LogicVision, Embedded Test, LogicVision Ready and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other trademarks and service marks are the property of their respective owners.