LV4 streamlines embedded test info onto nanometer-scale designs
San Jose, Calif. --September 22, 2003 -- LogicVision, Inc., (NASDAQ:LGVN), the leading provider of embedded test for integrated circuits and systems today announced its new generation of test solutions, LV2004(TM) LV2004 is an integrated family of products that streamlines the integration of embedded test into SOC designs and enables test automation and access at the design, debug and manufacturing test stages, and throughout the SOC life- cycle on boards and in the field. With LV2004, designers can easily integrate powerful embedded test structures into their designs, removing barriers to achieving significant quality and cost benefits downstream.
Check out the LV2004 Product Backgrounder.
Streamline Embedded Test Integration and Use
LV2004 presents new embedded test usability solutions that simplify embedded test integration into SOC designs, resulting in minimal design cycle impacts. An Embedded Test Planner™ predictive analysis tool is added to discover incompatibilities between an SOC's design architecture and embedded test requirements, thus minimizing design iterations. On the physical design side, improved links and automatic generation of design constraints and timing analysis increase the compatibility of test with the physical design process. A first industry use of Wrapper TAP (WTAP) technology enables hierarchical and thus fully scalable access to all embedded test structures, compatible with the IEEE P1500 industry standard. To allow designers to utilize LV2004 on faster platforms, Linux RedHat is now supported.
Improve Test and Debug Capabilities
LV2004 also includes a number of new advanced capabilities that help to further increase product quality and decrease test costs. Memory Built-In-Repair-Analysis embeds memory BIST controllers that perform repair analysis concurrently with the at-speed test of the memories. Improved contactless I/O test capability adds high accuracy I/O leakage testing using existing IEEE1149.1 boundary scan hardware. New automated test support for high speed AC-coupled I/O interconnects is fully compatible with the IEEE 1149.6 standard. In addition, two lower cost debug stations are now available from LVReady Partners, Inovy's Ocelot, and Teseda's V500. Both these ATE systems are now fully qualified with LV2004. Finally, to more easily integrate into existing and new manufacturing test environments, LV2004 has been integrated with and qualified on ATE platforms from Agilent (Smartest) and LTX (Envision).
"LV2004 pushes IC test boundaries by helping shrink product schedule timelines with lower test costs across the IC lifecycle. The design and cost quandary that designers face integrating a test solution are now dramatically reduced by up to two months," said Ron Mabry, LogicVision, Inc.'s vice president of marketing and business development. "LogicVision as the market leader on embedded test is the first to introduce a comprehensive solution that focuses on ease of use, increased test quality and overall savings of cost in the IC production cycle. LogicVision continues to extend its leadership in innovation to the benefit of our customers."
Availability, Pricing, and Distribution
The LV2004 features will be available in stages from Q4'2003 until Q1'2004 for Linux, Solaris and HP-UX operating systems. For more product details and pricing, please contact our sales offices via email at email@example.com.
About LogicVision Inc.
LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.
FORWARD LOOKING STATEMENTS:
Except for the historical information contained herein, the matters set forth in this press release, including statements as to the expected benefits of the combination of the Prover eCheck, and LogicVision's scalable hierarchical test technology and other expected benefits to mutual customers of the companies, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risk and uncertainties that could cause actual results to differ materially, including, but not limited to, the impact of competitive products and technological advances, and other risks detailed in LogicVision's Form 10-K for the year ended December 31, 2002, and from time to time in LogicVision's SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.
LogicVision, Embedded Test, LogicVision Ready and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other trademarks and service marks are the property of their respective owners.