Actel, LogicVision develop embedded test for programmable gate array cores

Actel, LogicVision develop embedded test for programmable gate array cores
By Semiconductor Business News
May 21, 2001 (11:51 a.m. EST)
URL: http://www.eetimes.com/story/OEG20010521S0044

SUNNYVALE, Calif. -- Programmable logic supplier Actel Corp. today announced a partnership with LogicVision Inc. to embed reusable test intellectual property in system-on-chip (SoC) designs.

The two Silicon Valley companies said they will collaborate to offer self-test solutions for Actel's new VariCore embedded programmable gate array cores, called "EPGA." The partnership aims to solve the growing problems in designing and testing SoC products, said the two companies.

"The challenge is not only to efficiently test these cores once they have been embedded into the SoC design, but to have the ability to re-use this test capability throughout the design, manufacturing and system deployment phases of the SoC product life," said Rodger Sykes, vice president of marketing and business development at LogicVision in San Jose. "Clearly, advantages can be gained by having the ability to reuse test to validate cores after remote and in-field reprogram ming."

Actel's VariCore EPGA logic functions are based on 0.18-micron SRAM technology. The cores were introduced in February to support reprogrammable "soft hardware" embedded in SoC designs, said Actel.

"Partnering with LogicVision will help assure that all elements of the customer's post-design test flow are reliably integrated, making an important contribution to our goal of providing a complete development solution," said Yankin Tanurhan, senior director of embedded FPGA at Actel in Sunnyvale.

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