1.8 V Bidirectional LVCMOS I/O combined with Analog Test Bus (ATB)

Features

• Operating frequency of 200 MHz (400 Mbps)
• Core supply is either 0.9 / 1.0 V (± 10%)
• I/O supply of 1.8 V (± 10%)
• Operates over temperature range of -40C to 125C
• ESD hardness of 2kV HBM and 500V CDM
• Latchup immune upto ±100 mA current injection
• Wire-bond and flip-chip compatible
• 3 mA, 7 mA, 15 mA and 18 mA programmable drive strengths
• Programmable pull-up and pull-down (15 KW)
• Selectable Schmitt trigger function for Rx
• Selectable Analog Test Bus
• Supports 8-layer (602) or 9-layer (702) metallization with Circuit-Under-Pad (CUP)
• Power supply sequence independent (PSSI)
• Compliant to JESD8-7A in 1.8 V mode
• Compliant to IEEE 802.3-2000 (MII) Electrical Specification

Benefits

• Services Available with this Product
• Customization
• SOC Integration
• Application & ESD Guidance
• Signal Integrity Analysis & Guidelines
• Characterization Support

Deliverables

• Specifications
• GDSII
• LEF file
• LVS netlist
• Verilog Model
• Timing Model
• Documentation

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