HOY technologies has many memory testing and repairing patens relate to NVM. HOY devoted in developing NVM's testing and repairing IP. NVM Test and Repair IP of HOY has big different from existing NVM test and repair technical. Our NVM test and repair IP can reduce NVM's testing time a lot and extend NVM's life cycle by using our specific NVM repairing technical.
Using ATE (Automation Test Equipment) is a traditional NVM's testing solution. The testing fee of NVM is higher than expectation of IoT and MCU's related vendors. In addition, the traditional NVM's testing method cannot support NVM's repair. Users only use ECC to repair single bit error of NVM, this repairing solutions is not efficient for these cost oriented IC. Therefore, HOY devoted in developing efficient NVM test and repair IP to reduce a lot of NVM's testing time and repair NVM IP based on patened NVM testing and repairing technical.