This innovative analog-to-digital data converter (ADC) combines high resolution, high sampling speed, and low power, and it is designed for high levels of radiation hardness. The ADC is hard to total ionizing dose (TID) of up to 3.5 Mrad(Si), and is immune to single-event latchup (SEL) and single-event functional interrupt (SEFI). Latency is below 100 ns, and power dissipation is 22.5 mW.
Ridgetop achieved high radiation hardness and performance levels using the IBM 8HP SiGe process.
The die is 4.6 x 4.6 mm, in a 48-pin QFN package. The pin-programmable sleep mode reduces power to 9 mW when idle.
- Pipeline architecture
- 40 MSPS sampling speed
- 12 bits resolution (10 bits ENOB)
- Rad-hard to >3.5 Mrad TID
- Rad-hard to >120 MeV-cm2/mg SEL
- Low power, 22.5 mW
- Thin-oxide 130 nm SiGe
- IBM 8HP high performance fabrication process
- Input analog bandwidth 50 MHz
- INL <1.5 LSB, DNL <0.95 LSB
- Sleep mode reduces power to 9 mW
- High resolution
- Low power consumption
- High levels of radiation hardness
- Government and commercial space microelectronics applications
- Medical imaging devices
- Defense applications such as missile control
- HIgh-energy physics (HEP) experiments
- X-ray cargo scanners
- Nuclear stockpile monitors
Block Diagram of the Rad-Hard Adjustable Sample Rate ADC, 12-bit, Ultra-Low Power