The DesignWare® Self-Test and Repair (STAR) Memory System™ is a comprehensive, integrated test, repair and diagnostics solution that supports repairable or nonrepairable embedded memories across any foundry, process node or memory IP vendor. Silicon-proven in over a billion chips on a range of process nodes, the STAR Memory System is a cost-effective solution for improving test quality and repair of manufacturing faults found in advanced technologies like FinFET.
The STAR Memory System’s highly automated design implementation and diagnostic flow enables SoC designers to achieve quick design closure and significantly improve time-to-market and time-to-yield in volume production. The STAR Memory System has been certified for the ISO 26262 automotive functional safety standard by SGS-TUV Saar GmbH, an independent accredited assessor. In addition, the test and repair support for e-flash and embedded MRAM enables the STAR Memory System to be used in IoT applications.