Quantum-Driven Hardware Root-of-Trust - Physical Unclonable Function (PUF)
IEEE 1149.1 (JTAG) eVC
From developing a JTAG TAP controller to designing a complete chip-level test architecture, the JTAG eVC can be a valuable tool for identifying design bugs, emphasizing protocol compatibility issues and ensuring smooth interoperability of testability features.
Combine this eVC with the new IEEE 1500 eVC for a complete System-on-Chip DFT verification solution.
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